Microscopy
Super Resolution Microscope
Nikon N-STORM Super Resolution Microscope & FRET
- Stochastic optical reconstruction microscopy
- Lateral resolution of ~20 nm
- Axial resolution of ~50 nm
- Multi-color imaging capability
- High definition, high density images
- NIS-Elements Software
- Multi-channel images
- Time lapse
- Multipoint functionality
- Image stitching
- Multidimensional image display
- 2D/3D Deconvolution
-
FRET (Fluorescence (贵枚谤蝉迟别谤) Resonance Energy Transfer) capabilities
颁辞苍迟补肠迟:听Dr. Christopher G. Gianopoulos
Scanning Electron Microscopy (SEM)
JEOL JSM-7500F with EDS Detector Attachment
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- Cold Cathode Field Emission Microscope
- Analyses samples up to dia. = 200 mm x height = 10 mm
- Various detectors, including:
- LABE - STEM - EBIC - EDS听听
- Cyber Enabled
- EDS attachment can be used for elemental mapping
- For an introduction to EDS theory and considerations for sample analysis see from the CMSC
- Gold and Carbon specimen coating available听
- Typical Operations Manual can be found here
- A Guide to Scanning Microscope Observation can be found here
- Here is an informative video about choosing the right SEM parameters:
- All samples must be completely dried before being placed in the SEM.
If you need help, please contact Dr. Kristen Kirschbaum
*Image above taken on our instrument of diatom
听 听Stereoscopic Light Microscope听
Olympus SZX7
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- Olympus SC100 camera directly attached
- Digital imaging
- Live video recording
- Images and measurements can be taken and viewed via a computer
Here are the manuals听for the听听and听听and a short听听explaining the proper setup.听
Contact: Dr. Kristin Kirschbaum